Researchers develop new X-ray detector

09 June 2020

Hyrbid perovskite films provide inexpensive route to detectors

Scientists at Los Alamos National Laboratory and Argonne National Laboratory have collaborated to develop a new type of X-ray detector that does not require an external power source. The detector is said to be 100 times more sensitive than conventional silicon-based ones. The high sensitivity and increased resolution could lead to lower exposure to X-rays for patients and imaging staff at hospitals and dentist surgeries.

The new detector is based on thin films of cheap and readily available hybrid perovskites which can be deposited as a film on surfaces by spraying solutions that cure and leave behind thin layers of the material. The team has demonstrated that thicker perovskite layers are also able to detect X-rays, but in this case they require a small voltage source to improve signal collection. The researchers suggest that the useful energy range of a detector with a thicker perovskite layers could be extended beyond X-rays to low energy γ-rays. ‘The current barrier for commercialisation of our detector is that we need to demonstrate a large area detector to meet the market needs for imaging, however, it is an engineering problem,’ the research team said.

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